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Nanoprofilometer

2000 incl. GST
Usage/Application Industrial
Material SS
Portable Portable
I Deal In New Only
Display Type Sleek
Color Black
Feature
Usage/Application Industrial
Material SS
Portable Portable
I Deal In New Only
Display Type Sleek
Color Black
Description

IMOS interference microscope – nanoprofilometer

IMOS enables precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Choosing the right optical profilometer system depends on your application's requirements, including speed, precision, vertical range, automation, and flexibility.


IMOS optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped and stepped. All measurements are nondestructive, fast, and require no special sample preparation. At the core of the system is interference of partially coherent light technology which delivers sub-nanometer precision measures a wider range of surfaces more precisely than other commercially-available technologies, thus optimizing your return on investment.

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