CIQTEK Model 3200 Scanning Electron Microscope (SEM), Tungsten Filament
| Brand | CIQTEK |
| Light Source | Tungsten Filament |
| Model Name/Number | 3200 |
| Minimum Order Quantity | 1 Piece |
Feature
| Brand | CIQTEK |
| Light Source | Tungsten Filament |
| Model Name/Number | 3200 |
| Minimum Order Quantity | 1 Piece |
Description
SEM3200 is a high-performance, versatile tungsten filament scanning electron microscope. With excellent imaging quality, compatible with low vacuum mode, can obtain high resolution images in different field of view. Large depth of field, imaging rich three-dimensional sense. Rich expandability helps you explore the world of microscopic imaging.
- Magnification : 1 to 300000x
- Accelerating voltage range : 0.2 kV - 30 kV
- High vacuum：3 nm @ 30 kV（SE），8 nm @ 3 kV（SE），4 nm @ 30 kV（BSE）
Low vacuum：3 nm @ 30 kV（SE） - Optical navigation
- Automatic image acquisition and stitching
- Hybrid imaging（SE+BSE） The composition and surface information of the sample is observed in an image
- Double anode structure
Improved resolution and image quality at low voltage - Low vacuum mode
Provides sample surface details and morphology at low vacuum, and the software switches the vacuum state with one click
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