Atomic Force Microscope
Description
Nanoprofiler AFM for technical samples, wafers and discs
Three sample stage options to accommodate substrates up to 200 x 200 x 20 mm
Integrated high resolution video microscope
Linearized XY piezoelectric scanner
Accommodates standard-sized AFM probes
Includes vibrating and non-vibrating topography modes, plus lateral force and phase mode imaging
Utilizes a direct drive motorized probe approach
Captures images with intuitive LabVIEW™-based software
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C-108, Maruti Darshan, Hanuman Chowk, Mulund East Mumbai - 400081, Maharashtra, India
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