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CIQTEK Model 3200 Scanning Electron Microscope (SEM), Tungsten Filament
Nanoprofilometer
X-ray analytical microscope-microprobe, For Laboratory
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Phadke Instruments Pvt Ltd
Andheri East
27AAICP0797Q1ZI
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Phadke Instruments Pvt Ltd
Andheri East
GST No.27AAICP0797Q1ZI
Verified Supplier
+91-
Send Email
Home
Product
CIQTEK Model 3200 Scanning Electron Microscope (SEM), Tungsten Filament
Nanoprofilometer
X-ray analytical microscope-microprobe, For Laboratory
About Us
Contact Us
About Us
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X-ray analytical microscope-microprobe, For Laboratory
Nanoprofilometer
CIQTEK Model 3200 Scanning Electron Microscope (SEM), Tungsten Filament
